著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
HASHIZUME Masaki and TAKEDA Teppei and ICHIMIYA Masahiro and YOTSUYANAGI Hiroyuki and MIURA Yukiya and KINOSHITA Kozo,IDDQ Test Time Reduction by High Speed Charging of Load Capacitors of CMOS Logic Gates,IEICE transactions on information and systems,09168532,一般社団法人電子情報通信学会,2002-10-01,85,10,1534-1541,https://cir.nii.ac.jp/crid/1570854177260582912,