Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
OHTA A. and YAJIMA K. and HIGASHISAKA N. and HEIMA T. and HISAKA T. and TANINO N.,Electromigration in gold line of GaAs IC,IEICE technical report. Electron devices,,"The Institute of Electronics, Information and Communication Engineers",1999-01-20,98,517,53-59,https://cir.nii.ac.jp/crid/1570854177379348864,