Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
YAJIMA Kotaro and KASHIWA Takuo and SASAKI Hajime and KOMARU Makio and YOSHIDA Naoto and MIZUGUCHI Kiyoshi,Electromigration Hardness of Planer GaAs Schottky Barrier Diodes,IEICE technical report. Reliability,,"The Institute of Electronics, Information and Communication Engineers",1996-03-15,95,585,7-11,https://cir.nii.ac.jp/crid/1570854177467444352,