Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Fujimura Shuzo and Ogawa Hiroki and Ishikawa Kenji and Inomata Carlos and Mori Haruhisa,Observation of Sinative oxide growth using FT-IR-ATR and FT-IR-RAS,Technical report of IEICE. SDM,,"The Institute of Electronics, Information and Communication Engineers",1993-04-22,93,7,43-50,https://cir.nii.ac.jp/crid/1570854177467475968,