著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
HASHIZUME Masaki and HOSHIKA Hiroshi and YOTSUYANAGI Hiroyuki and TAMESADA Takeomi,Testable Static CMOS PLA for IDDQ Testing,"IEICE transactions on fundamentals of electronics, communications and computer sciences",09168508,一般社団法人電子情報通信学会,2001-06-01,84,6,1488-1495,https://cir.nii.ac.jp/crid/1571135652357071360,