著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
HIGAMI Yoshinobu and KAJIHARA Seiji and POMERANZ Irith and KOBAYASHI Shin-ya and TAKAMATSU Yuzo,On Finding Don't Cares in Test Sequences for Sequential Circuits,IEICE transactions on information and systems,09168532,一般社団法人電子情報通信学会,2006-11-01,89,11,2748-2755,https://cir.nii.ac.jp/crid/1571135652567545344,