著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
DE Kaushik,Test Methodology for Embedded Cores which Protects Intellectual Property,"IEEE VLSI Test Symposium, 1996",,,1996,,,,https://cir.nii.ac.jp/crid/1571417125598492032,