Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
MIYAMOTO Naoki and KAWAHARA Takayuki and SAEKI Syunichi and JYOUNO Yusuke and KATO Masataka and KIMURA Katsutaka,High-Reliability Programming Technique Using Variable Word-Line Voltage for Flash Memories,Technical report of IEICE. SDM,,"The Institute of Electronics, Information and Communication Engineers",1995-11-22,95,380,45-51,https://cir.nii.ac.jp/crid/1571698602396208000,