Effects of Temperature, Forward current, and Commutating di/dt on the Reverse recovery Behavior of Fast Power Diodes

1 Citations

Journal

  • EPE'95

    EPE'95 1.577-1.582, 1995

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Details 詳細情報について

  • CRID
    1572261549115590400
  • NII Article ID
    10004297526
  • Data Source
    • CiNii Articles

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