著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
CHIANG Sinclair and YOU J. W. and LU C. T. and LU M. F. and HUANG-LU S. and CHIEN S. C.,A Novel Explanation of Substrate Bias Dependent Dielectric Breakdown Behavior with Channel Quantization Effect in Ultrathin Oxide pMOSFETs,Extended abstracts of the ... Conference on Solid State Devices and Materials,,,2005-09-13,2005,,500-501,https://cir.nii.ac.jp/crid/1572543025509176576,