Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
ICHIKAWA Kimiko and TSUNENO Katsumi and SATO Hisako and MASUDA Hiroo,Sensitivity Analysis of Device Characteristic in CMOS using TCAD,Technical report of IEICE. VLD,,"The Institute of Electronics, Information and Communication Engineers",1996-09-27,96,259,9-15,https://cir.nii.ac.jp/crid/1572543027222422272,