Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
KAWAKAMI Y.,Investigation of Soft Error Rate Including Multi-Bit Upsets in Advanced SRAM Using Neutron Irradiation Test and 3D Mixed-Mode Device Simulation,"2004 IEDM, December 12-15, San Francisco",,,2004,,,,https://cir.nii.ac.jp/crid/1572824500237014528,