著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
WILK R.,Continuous wave terahertz spectrometer as a noncontact thickness measuring device,Appl. Opt.,,,2008,47,,3023-3026,https://cir.nii.ac.jp/crid/1573105975982869376,