Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Adachi Tetsuo and Kato Masataka and Tanaka Toshihiro and Ushiyama Masahiro and Kure Tokuo and Morimoto Tadao and Miyamoto Naoki and kume kinn,Effects of Floating Gate Structure on Reliability in Flash Memories,Technical report of IEICE. SDM,,"The Institute of Electronics, Information and Communication Engineers",1994-12-16,94,407,41-46,https://cir.nii.ac.jp/crid/1573105977274320640,