A-3-7 Worst-case Bit-Write-Reducing and Error-Correcting Code Generation by One-to-many Mapping for Non-Volatile Memories

  • Kojo Tatsuro
    Dept. of Computer Science and Communications Engineering, Waseda University
  • Tawada Masashi
    Dept. of Computer Science and Communications Engineering, Waseda University
  • Yanagisawa Masao
    Dept. of Computer Science and Communications Engineering, Waseda University
  • Togawa Nozomu
    Dept. of Computer Science and Communications Engineering, Waseda University

Bibliographic Information

Other Title
  • A-3-7 不揮発メモリを対象に最悪書込みビット数削減と誤り訂正を両立する一対多符号構成手法(A-3.VLSI設計技術,一般セッション)

Search this article

Journal

Details

  • CRID
    1573105977719604096
  • NII Article ID
    110009996035
  • NII Book ID
    AA12732012
  • ISSN
    2189700X
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

Report a problem

Back to top