A-3-7 Worst-case Bit-Write-Reducing and Error-Correcting Code Generation by One-to-many Mapping for Non-Volatile Memories
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- Kojo Tatsuro
- Dept. of Computer Science and Communications Engineering, Waseda University
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- Tawada Masashi
- Dept. of Computer Science and Communications Engineering, Waseda University
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- Yanagisawa Masao
- Dept. of Computer Science and Communications Engineering, Waseda University
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- Togawa Nozomu
- Dept. of Computer Science and Communications Engineering, Waseda University
Bibliographic Information
- Other Title
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- A-3-7 不揮発メモリを対象に最悪書込みビット数削減と誤り訂正を両立する一対多符号構成手法(A-3.VLSI設計技術,一般セッション)
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Journal
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- Proceedings of the IEICE Engineering Sciences Society/NOLTA Society Conference
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Proceedings of the IEICE Engineering Sciences Society/NOLTA Society Conference 2015 52-, 2015-08-25
The Institute of Electronics, Information and Communication Engineers
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Details
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- CRID
- 1573105977719604096
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- NII Article ID
- 110009996035
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- NII Book ID
- AA12732012
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- ISSN
- 2189700X
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- Text Lang
- ja
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- Data Source
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- CiNii Articles