著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
SATO Takashi,A MOS Transistor Array for Accurate Measurement of Subthreshold Leakage Variation,"2007 IEEE, Proceedings of the 8^<th> International Symposium on Quality Electronic Design(ISQED'07)",,,2007,,,,https://cir.nii.ac.jp/crid/1573387449090896256,