著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
AMELINCKX S.,The study of planar interfaces by means of electron microscopy,Modern Diffraction and Imaging Techniques in Material Science,,,1970,,,257-294,https://cir.nii.ac.jp/crid/1573387449471691520,