著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
OHSUMI K.,Development of a system to analyse the structure of a submicrometer-sized single crystal by synchrotron X-ray diffraction,J. Appl. Cryst.,,,1991,24,,340-348,https://cir.nii.ac.jp/crid/1573387451502881536,