Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Watanabe Yukimune and Saitoh Tadashi,Characterization of Strained InGaAs/GaAs Structures using Spectroscopic Ellipsometry,IEICE technical report. Electron devices,,"The Institute of Electronics, Information and Communication Engineers",1993-11-19,93,326,43-47,https://cir.nii.ac.jp/crid/1573668927146322432,