著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
YOTSUYANAGI Hiroyuki and IWAKIRI Taisuke and HASHIZUME Masaki and TAMESADA Takeomi,Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field,IEICE transactions on information and systems,09168532,一般社団法人電子情報通信学会,2003-12-01,86,12,2666-2673,https://cir.nii.ac.jp/crid/1573668927254908928,