Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
MINE Hisashi,Failure Rate Model of MIL-HDBK-217F,IEICE technical report. Reliability,,"The Institute of Electronics, Information and Communication Engineers",1997-11-07,97,370,1-6,https://cir.nii.ac.jp/crid/1573950402209968512,