著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
AO Jin-Ping and KIKUTA Daigo and KUBOTA Naotaka and NAOI Yoshiki and OHNO Yasuo,High-Temperature Stability of Copper-Gate AlGaN/GaN High Electron Mobility Transistors,IEICE transactions on electronics,09168524,一般社団法人電子情報通信学会,2003-10-01,86,10,2051-2057,https://cir.nii.ac.jp/crid/1573950402232322944,