Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
LEE Hochul and YOON Youngchang and JEON Jongwook and SHIN Hyungcheol,Analysis of Random Telegraph Signal Noise in Dual and Single Oxide Device And Its Application to CMOS Image Sensor Readout Circuit,Extended abstracts of the ... Conference on Solid State Devices and Materials,,,2007-09-19,2007,,898-899,https://cir.nii.ac.jp/crid/1574231875379530496,