著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
ZHANG J.,An adjustable clock scan structure for reducing testing peak power,"Proc. International Conference on Electronic Measurement and Instruments, 2007",,,2007,,,373-377,https://cir.nii.ac.jp/crid/1574231875777216896,