著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
HASHIZUME Masaki and ICHIMIYA Masahiro and YOTSUYANAGI Hiroyuki and TAMESADA Takeomi,CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply,IEICE transactions on information and systems,09168532,一般社団法人電子情報通信学会,2002-10-01,85,10,1542-1550,https://cir.nii.ac.jp/crid/1574231876981112832,