Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
HIRAO Hideyo and TUBOTA Yosimi and AOKI Masahumi,Contact reliability of connector,IEICE technical report. EMD,,"The Institute of Electronics, Information and Communication Engineers",1996-01-19,95,472,1-6,https://cir.nii.ac.jp/crid/1574231877082766208,