Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Nakamori Yasuhiko and Moriguchi Kohei and Komiya Kenji and Omura Yasuhisa,Physics-based model of quantum-mechanical wave function penetration into thin dielectric films for evaluating modern MOS capacitors,関西大学先端科学技術推進機構研究報告,,Kansai University,2008,23,,113-121,https://cir.nii.ac.jp/crid/1574231877298575488,