{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1583387451159630976.json","@type":"Researcher","foaf:Person":[{"foaf:name":[{"@language":"en","@value":"CHENG C. C."}]}],"product":[{"@id":"https://cir.nii.ac.jp/crid/1573387451159630976","@type":"Article","productIdentifier":[{"@type":"NAID","@value":"20000187098"}],"notation":[{"@language":"en","@value":"General analysis of probe coils near stratified conductors"}],"relation":[{"type":"creator"}]}],"dataSourceIdentifier":[{"@type":"CIA","@value":"20000187098_W54WAsuaAy2V7mPWSsJj6QcRSoA"}]}