Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Y. Hao and S. Horiguchi and X. Jiang,A new defect outline model used for critical area estimation in VLSI,Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems,,IEEE Comput. Soc,2002-11-07,,,21-29,https://cir.nii.ac.jp/crid/1870020692567424384,https://doi.org/10.1109/dftvs.2000.886970