著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Fumiyoshi Matsuoka and Y. Hiruta and K. Maeguchi and K. Hama and Hiroshi Iwai and Koichi Kanzaki,+ BT Instability in P<sup>+</sup>poly gate MOS structure,1987 International Electron Devices Meeting,,IRE,1987-01-01,,,578-581,https://cir.nii.ac.jp/crid/1870020693336792832,https://doi.org/10.1109/iedm.1987.191492