著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
M. Tsuzaka and K. Oda,Evaluation of Moire artifacts with stationary anti-scatter grids in amorphous selenium-based flat panel x-ray detector system,SPIE Proceedings,0277-786X,SPIE,2007-03-08,6510,,651040,https://cir.nii.ac.jp/crid/1870302167766352512,https://doi.org/10.1117/12.710639