著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Y. Ogami and S. Ishikawa and K. Kato,Pattern association from noisy images by the network constraint analysis,Proceedings of IECON '93 - 19th Annual Conference of IEEE Industrial Electronics,,IEEE,2002-12-30,,,1382-1385,https://cir.nii.ac.jp/crid/1870302167939746304,https://doi.org/10.1109/iecon.1993.339270