Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Shintani and Ohara and Inoue and Ichihara,Test response compression based on Huffman coding [logic IC testing,Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03,,IEEE,2003-01-01,,,446-449,https://cir.nii.ac.jp/crid/1870583642899595904,https://doi.org/10.1109/ats.2003.1250854