著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Xavier Défago and Takuya Katayama and Naohiro Hayashibara and Rami Yared,The /spl phi/ accrual failure detector,"Proceedings of the 23rd IEEE International Symposium on Reliable Distributed Systems, 2004.",,IEEE,2004-01-01,,,66-78,https://cir.nii.ac.jp/crid/1870583643216059648,https://doi.org/10.1109/reldis.2004.1353004