Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
John G. McInerney and Marek Osinski and Ki-Hyun Chung,Measurement Of Semiconductor .Laser Linewidth Enhancement Factor Using Coherent Optical Feedback,SPIE Proceedings,0277-786X,SPIE,1989-06-22,1043,,175,https://cir.nii.ac.jp/crid/1870583643234360064,https://doi.org/10.1117/12.976369