Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Hideo Fujiwara and Tomoo Inoue and Satoshi Ohtake,Sequential test generation based on circuit pseudo-transformation,Proceedings Sixth Asian Test Symposium (ATS'97),,IEEE Comput. Soc,2002-11-23,,,62-67,https://cir.nii.ac.jp/crid/1870865118048080384,https://doi.org/10.1109/ats.1997.643919