著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
M. Kitamura and Hiromu Fujioka and Akihisa Chikamura and Koji Nakamae,TAT- and cost-reduction strategies in LSI manufacturing test process,10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295),,IEEE,2003-01-20,,,59-63,https://cir.nii.ac.jp/crid/1870865118179502080,https://doi.org/10.1109/asmc.1999.798182