Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
David Z. Pan and Bei Yu and Tetsuaki Matsunawa,Laplacian eigenmaps- and Bayesian clustering-based layout pattern sampling and its applications to hotspot detection and optical proximity correction,"Journal of Micro/Nanolithography, MEMS, and MOEMS",1932-5150,SPIE-Intl Soc Optical Eng,2016-10-21,15,,043504,https://cir.nii.ac.jp/crid/1871428068073240832,https://doi.org/10.1117/1.jmm.15.4.043504