Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Masaharu Nishiguchi and Yasutaka Morikawa and Roy White and Haruo Kokubo and Lee Terrill and Naoya Hayashi and Ron Bozak,Defect repair performance using the nanomachining repair technique,SPIE Proceedings,0277-786X,SPIE,2003-08-26,5130,,520,https://cir.nii.ac.jp/crid/1871428068191507968,https://doi.org/10.1117/12.504213