Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Yuki Yoshikawa and Tomoo Inoue and Nobukazu Izumi and Hideyuki Ichihara,A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic,"2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications",,IEEE,2010-01-01,,,345-349,https://cir.nii.ac.jp/crid/1871709542527767680,https://doi.org/10.1109/delta.2010.52