著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Toshihiro Matsuda and M. Yuzaki and E. Kameda and Takashi Ohzone,A study on hot-carrier-induced photoemission in n-MOSFETs under dynamic operation,ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095),,IEEE,2002-11-07,,,75-80,https://cir.nii.ac.jp/crid/1871709543146720128,https://doi.org/10.1109/icmts.2000.844408