著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Shuichi Kameyama and Hiroshi Takahashi and Hiroshi Furutani and Yoshinobu Higami and Takao Sakai,Test Pattern Selection for Defect-Aware Test,2011 Asian Test Symposium,,IEEE,2011-11-01,,,102-107,https://cir.nii.ac.jp/crid/1871991017830442112,https://doi.org/10.1109/ats.2011.24