著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Hidetoshi Onodera and Keikichi Tamaru and M. Kondo,A systematic and physical application of multivariate statistics to MOSFET I-V models,1999 4th International Workshop on Statistical Metrology (Cat. No.99TH8391),,IEEE,2003-01-20,,,34-37,https://cir.nii.ac.jp/crid/1871991017920234496,https://doi.org/10.1109/iwstm.1999.773190