Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Naoki Ohashi and Haruki Ryoken and Hajime Haneda and Isao Sakaguchi and Yutaka Adachi and Takeshi Ohgaki,Defect structures in undoped and doped ZnO films studied by solid state diffusion,MRS Proceedings,0272-9172,Springer Science and Business Media LLC,2004-01-01,829,,,https://cir.nii.ac.jp/crid/1871991017954697856,https://doi.org/10.1557/proc-829-b2.23