Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Hiroshi Muramatsu and Hyen-Wook Kang and Yoshiteru Kawashima,Fabrication of long tip AFM probes for highly coarse samples,10th IEEE International Conference on Nanotechnology,,IEEE,2010-08-01,,,386-389,https://cir.nii.ac.jp/crid/1871991018049173760,https://doi.org/10.1109/nano.2010.5697902