著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
S. Mori and K. Sasaki and Susumu Shuto and M. Sonoda and T. Idaka and M. Tanaka,Impact of passivation film deposition and post-annealing on the reliability of flash memories,1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual,,IEEE,2002-11-22,,,17-24,https://cir.nii.ac.jp/crid/1871991018069308544,https://doi.org/10.1109/relphy.1997.584223