著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Haruhiko Yoshida and Hidenobu Mori,Microscopic Imaging of Inversion Layer Formation in Insulator/Semiconductor Structure by Scanning Capacitance Transient Microscopy,"2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)",,IEEE,2018-06-01,,,1-2,https://cir.nii.ac.jp/crid/1872272492753584256,https://doi.org/10.1109/imfedk.2018.8581941