著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Kazuhiro Gotoh and Motoo Morimura and Kyotaro Nakamura and Atsushi Ogura and Ryo Ozaki and Shimako Naitou and Takefumi Kamioka and Noritaka Usami and Yutaka Hayashi and Yoshio Ohshita,Surface inversion layer effective minority carrier mobility as one of the measures of surface quality of the p-aSi:H/i-aSi:H/cSi heterojunction solar cell,Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials,,The Japan Society of Applied Physics,2019-09-05,,,,https://cir.nii.ac.jp/crid/1872272493046352512,https://doi.org/10.7567/ssdm.2019.c-6-02