著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
K. Ohara and T. Murakami and Y. Hiwatari and Yutaka Kaneko,Computer simulation of thin film growth with defect formation,Surface and Coatings Technology,0257-8972,Elsevier BV,2003-06-01,169-170,,215-218,https://cir.nii.ac.jp/crid/1872272493121170432,https://doi.org/10.1016/s0257-8972(03)00082-3