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Description
A simplified probabilistic fault grading method is described. The concept of propagation probability is introduced in place of the sensitization probability of STAFAN, and the empirical parameters of STAFAN are eliminated. The division of input vectors into subsets is monitored by the activation or toggle rate. The accuracy of the method is examined for fault coverage estimation and for predicting the undetected faults.
Journal
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- Journal of Electronic Testing
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Journal of Electronic Testing 1 235-238, 1990-10-01
Springer Science and Business Media LLC
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Details 詳細情報について
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- CRID
- 1872553967821518976
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- ISSN
- 15730727
- 09238174
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- Data Source
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- OpenAIRE